Electrical Overstress/Electrostatic Discharge Symposium proceedings ., Practical statistical analysis for the reliability engineer



Practical statistical analysis for the reliability engineer

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0001156295 / 1983-07-22
Date of Publication:
July 13, 1983
Date of Creation:
1983
Title:
Practical statistical analysis for the reliability engineer : state of the art rept. / Reliability Analysis Center ; prepared by Kieron A. Dey.
Series:
SOAR;2
Imprint:
Griffiss A F B, NY : RAC, 1983.
Description:
203 p.
Other Title:
S O A R ;2
Copyright Claimant:
I I T Research Institute
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Kieron A. Dey
IIT Research Institute (65 documents)
example document: Electrostatic discharge susceptibility data of microcircuit

Copyrights records by IIT Research Institute

IIT Research Institute. Reliability Analysis Center
Reliability Analysis Center.

IC quality grades

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0001718626 / 1985-12-23
Date of Publication:
March 18, 1985
Date of Creation:
1985
Title:
IC quality grades : impact on system reliability and life cycle cost / Reliability Analysis Center ; prepared by Mary Gossin Priore.
Application Title:
State-of-the-art report, I C quality grades, impact on system reliability and life cycle cost (S O A R-3)
Series:
SOAR;3
Imprint:
Griffiss A F B, NY : RAC, c1985.
Description:
98 p.
Other Title:
S O A R ;3
State-of-the-art report, I C quality grades, impact on system reliability and life cycle cost (S O A R-3)
Copyright Claimant:
I I T Research Institute
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Mary Gossin Priore
IIT Research Institute (65 documents)
example document: Electrostatic discharge control manufacturing guidelines
IIT Research Institute. Reliability Analysis Center
Reliability Analysis Center.

Microcircuit screening data, 1987

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0002250687 / 1988-02-04
Date of Publication:
December 17, 1987
Date of Creation:
1987
Title:
Microcircuit screening data, 1987 / prepared by the Reliability Analysis Center.
Application Title:
Microcircuit screening data--MDR-22.
Basis of Claim:
New Matter: "compilation and some new text."
Description:
1 v.
Copyright Claimant:
I I T Research Institute
Authorship on Application:
compilation and new text: I I T Research Institute, employer for hire.
Names:
Reliability Analysis Center

Copyrights records by Reliability Analysis Center

IIT Research Institute (65 documents)
example document: Benchmarking commercial reliability practices

Discrete semiconductor reliability transistor/diode data

Title:
Discrete semiconductor reliability transistor/diode data / Reliability Analysis Center ; prepared by Joseph V. Beasock.
Application Title:
Transistor/diode data ....
Basis of Claim:
New matter: additions & revisions.
Serial Publication Year:
1980
Imprint:
Griffiss Air Force Base, NY : Reliability Analysis Center.
Description:
print material.
Frequency:
Annually.
Description based on:
No. DSR-3, winter 1979-1980.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
data compilation & analysis: I I T Research Institute, employer for hire.
Names:
Joseph V. Beasock
Reliability Analysis Center (42 documents)
example document: Failure mode/mechanism distributions, 1991
IIT Research Institute.

Copyrights records by IIT Research Institute.

EOS/ESD technology abstracts

Title:
EOS/ESD technology abstracts / Reliability Analysis Center ; prepared by Eugene Kraeger, Wayne Grimaldi.
Application Title:
Technical reliability study E O S/E S D technical abstracts.
Serial Publication Year:
1981
Imprint:
Griffiss Air Force Base, NY : The Center.
Description:
print material.
Frequency:
Frequency unknown.
Other Title:
Technical reliability studies ; TRS-3
Description based on:
winter 80-81 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Eugene Kraeger
Wayne Grimaldi
Reliability Analysis Center
IIT Research Institute

Linear/interface data

Title:
Linear/interface data / [compiled by the] Reliability Analysis Center ; prepared by Wayne E. Turkowski.
Basis of Claim:
New matter: compilation, additions & revisions.
Serial Publication Year:
1981
Imprint:
Griffiss Air Force Base, NY : The Center.
Description:
print material.
Frequency:
Annually.
Description based on:
winter 1980/81 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Wayne E. Turkowski
Reliability Analysis Center
IIT Research Institute
Microcircuit device reliability ; MDR-16

Linear/interface data

Title:
Linear/interface data / [compiled by the] Reliability Analysis Center ; prepared by Wayne E. Turkowski.
Serial Publication Year:
1985
Imprint:
Griffiss Air Force Base, NY : The Center.
Description:
print material.
Frequency:
Annually.
Other Title:
Microcircuit device reliability
Description based on:
Winter 1980/81 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Wayne E. Turkowski
Reliability Analysis Center
IIT Research Institute

Electrical Overstress/Electrostatic Discharge Symposium proceedings .

Title:
Electrical Overstress/Electrostatic Discharge Symposium proceedings . / Reliability Analysis Center ; sponsored by I I T Research Institute.
Serial Publication Year:
1983
Imprint:
Griffiss A F B, N. Y. : RAC.
Description:
print material.
Frequency:
Annually.
Variant title:
EOS/ESD Symposium proceedings.
Description based on:
1981 issue.
Copyright Claimant:
I I T Research Institute.
Names:
Electrical Overstress/Electrostatic Discharge Symposium, LasVegas, 1981
Reliability Analysis Center
IIT Research Institute
Electrical Overstress/Electrostatic Discharge Symposium, Orlando, 1982

Electrical Overstress/Electrostatic Discharge Symposium proceedings .

Title:
Electrical Overstress/Electrostatic Discharge Symposium proceedings . / Reliability Analysis Center ; sponsored by I I T Research Institute.
Serial Publication Year:
1985
Imprint:
Griffiss A F B, N. Y. : RAC.
Description:
print material.
Frequency:
Annually.
Variant title:
EOS/ESD symposium proceedings.
Description based on:
1981 issue.
Copyright Claimant:
E O S/E S D Association, Inc.
Authorship on Application:
E O S/E S D Association, Inc., employer for hire.
Names:
Reliability Analysis Center
IIT Research Institute
Electrical Overstress/Electrostatic Discharge Symposium, Philadelphia, 1984
EOS/ESD Association, Inc.

Copyrights records by EOS/ESD Association, Inc.

Electrical Overstress/Electrostatic Discharge Symposium proceedings .

Title:
Electrical Overstress/Electrostatic Discharge Symposium proceedings . / sponsored by the E O S/E S D Association and I I T Research Institute.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1989
Imprint:
Westmoreland, NY : The Association.
Description:
print material.
Frequency:
Annually.
Variant title:
EOS/ESD Symposium proceedings.
Description based on:
1985 issue.
Authorship on Application:
E O S/E S D Association, Inc., employer for hire.
Names:
IIT Research Institute
Electrical Overstress/Electrostatic Discharge Symposium, Minneapolis, 1985
EOS/ESD Association, Inc.

Microcircuit device reliability

Title:
Microcircuit device reliability / Reliability Analysis Center.
Application Title:
Memory/digital L S I data ....
Serial Publication Year:
1982
Imprint:
Griffiss Air Force Base, N. Y. : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Description based on:
No. 6, autumn 1977.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Reliability Analysis Center
IIT Research Institute

Microcircuit device reliability

Title:
Microcircuit device reliability / Reliability Analysis Center.
Serial Publication Year:
1984
Imprint:
Griffiss Air Force Base, N. Y. : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Other Title:
Digital SSI/MSI data
Field experience database
Microcircuit device reliability trend analysis, 1985
Description based on:
No. 6, autumn 77.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
text & compilation: I I T Research Institute, employer for hire.
Names:
Thomas A. Ballou
Susan B. Stockman
Donald E. Rash
Reliability Analysis Center
IIT Research Institute

Nonelectronic parts reliability data

Title:
Nonelectronic parts reliability data / Reliability Analysis Center ; prepared by Donald W. Fulton.
Serial Publication Year:
1978
Imprint:
Griffiss Air Force Base, N. Y. : RAC, 1978-.
Description:
print material.
Frequency:
Frequency unknown.
Publication History:
No. 1-
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
data analysis & compilation: I I T Research Institute, employer for hire.
Names:
Donald W. Fulton
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Electrostatic discharge susceptibility data of microcircuit

Nonelectronic parts reliability data

Title:
Nonelectronic parts reliability data / Reliability Analysis Center ; prepared by Robert G. Arno.
Serial Publication Year:
1981
Imprint:
Griffiss A F B, NY : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Description based on:
Rept. no. NPRD-2, summer 1981 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Robert G. Arno
Reliability Analysis Center
IIT Research Institute

Electronic equipment maintainability data

Title:
Electronic equipment maintainability data / Reliability Analysis Center ; prepared by Norman B. Fuqua.
Serial Publication Year:
1980
Imprint:
Griffiss Air Force Base, NY : RAC, 1980-.
Description:
print material.
Frequency:
Frequency unknown.
Publication History:
Fall 1980-
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Norman B. Fuqua
Reliability Analysis Center
IIT Research Institute

Electronic equipment reliability data

Title:
Electronic equipment reliability data / Reliability Analysis Center ; prepared by Karl H. Huss.
Serial Publication Year:
1980
Imprint:
Griffiss Air Force Base, NY : RAC, 1980-.
Description:
print material.
Frequency:
Frequency unknown.
Publication History:
Fall 1980-
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Karl H. Huss
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Electrostatic discharge susceptibility data of microcircuit

Electrical Overstress/Electrostatic Discharge Symposium proceedings .

Title:
Electrical Overstress/Electrostatic Discharge Symposium proceedings . / Reliability Analysis Center ; sponsored by I I T Research Institute.
Serial Publication Year:
1982
Imprint:
Griffiss A F B, N. Y. : RAC.
Description:
print material.
Frequency:
Annually.
Variant title:
EOS/ESD Symposium proceedings.
Description based on:
1981 issue.
Copyright Claimant:
I I T Research Institute.
Names:
Electrical Overstress/Electrostatic Discharge Symposium, Orlando, 1982
IIT Research Institute
Reliability Analysis Center
Electrical Overstress/Electrostatic Discharge Symposium, LasVegas, 1981

Electrical Overstress/Electrostatic Discharge Symposium proceedings .

Title:
Electrical Overstress/Electrostatic Discharge Symposium proceedings . / Reliability Analysis Center ; sponsored by I I T Research Institute.
Serial Publication Year:
1984
Imprint:
Griffiss A F B, N. Y. : RAC.
Description:
print material.
Frequency:
Annually.
Variant title:
EOS/ESD symposium proceedings.
Description based on:
1981 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Reliability Analysis Center (42 documents)
example document: Electrostatic discharge susceptibility data, 1991
Electrical Overstress/Electrostatic Discharge Symposium, Las Vegas, 1983
IIT Research Institute.

Electrical Overstress/Electrostatic Discharge Symposium proceedings .

Title:
Electrical Overstress/Electrostatic Discharge Symposium proceedings . / sponsored by the E O S/E S D Association and I I T Research Institute.
Serial Publication Year:
2003
Imprint:
Westmoreland, NY : The Association.
Description:
print material.
Frequency:
Annually.
Variant title:
EOS/ESD Symposium proceedings.
Description based on:
1985 issue.
Copyright Claimant:
Institute of Electrical and Electronics Engineers, Inc. (employer for hire)
Names:
IIT Research Institute
EOS/ESD Association

Copyrights records by EOS/ESD Association

Institute of Electrical and Electronics Engineers, Inc. (1741 documents)
example document: Spread spectrum techniques

Copyrights records by Institute of Electrical and Electronics Engineers, Inc.

ESD protective material and equipment

Title:
ESD protective material and equipment : a critical review : state-of-the-art-report / Reliability Analysis Center ; prepared by Norman B. Fuqua.
Serial Publication Year:
1982
Imprint:
Griffiss Air Force Base, NY : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Description based on:
Spring 1982 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Norman B. Fuqua
Reliability Analysis Center
IIT Research Institute

Analysis techniques for mechanical reliability

Title:
Analysis techniques for mechanical reliability / Reliability Analysis Center ; prepared by Richard J. Sadlon.
Serial Publication Year:
1985
Imprint:
Griffiss Air Force Base, NY : RAC, 1985-.
Description:
print material.
Frequency:
Frequency unknown.
Publication History:
Fall 1985-
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
text & compilation: I I T Research Institute, employer for hire.
Names:
Richard J. Sadlon
Reliability Analysis Center
IIT Research Institute
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