Failure reporting, analysis, and corrective action system (FRACAS) application guidelines



Subject index to MIL-HDBK-338 electronic reliability design handbook, 1989

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0002684029 / 1989-09-01
Date of Publication:
August 10, 1989
Date of Creation:
1989
Date in Notice:
notice: 1988
Title:
Subject index to MIL-HDBK-338 electronic reliability design handbook, 1989 / prepared by Reliability Analysis Center.
Copyright Note:
C.O. correspondence.
Imprint:
Rome, NY : The Center, c1988.
Description:
54 p.
Copyright Claimant:
IIT Research Institute
Authorship on Application:
compilation and some new text: IIT Research Institute, employer for hire.
Names:
Reliability Analysis Center

Copyrights records by Reliability Analysis Center

IIT Research Institute

Copyrights records by IIT Research Institute

A Guide for implementing total quality management

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003069092 / 1990-10-19
Date of Publication:
June 4, 1990
Date of Creation:
1990
Title:
A Guide for implementing total quality management : state-of-the-art report / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: "compilation and some new text."
Copyright Note:
C.O. correspondence.
Series:
SOAR ; 7
Description:
1 v.
Other Title:
SOAR ; 7
Copyright Claimant:
IIT Research Institute
Authorship on Application:
IIT Research Institute, employer for hire.
Names:
Reliability Analysis Center
IIT Research Institute

A Primer for DoD reliability, maintainability, safety, and logistics standards, 1992

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003228193 / 1992-01-14
Date of Publication:
October 30, 1991
Date of Creation:
1991
Title:
A Primer for DoD reliability, maintainability, safety, and logistics standards, 1992 / prepared by Reliability Analysis Center under contract to Rome Laboratory.
Basis of Claim:
New Matter: compilation, additions.
Copyright Claimant:
IIT Research Institute
Authorship on Application:
IIT Research Institute, employer for hire.
Names:
Reliability Analysis Center
Rome Laboratory
IIT Research Institute

Assessment of GaAs device quality and reliability, 1991

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003426056 / 1992-11-03
Date of Publication:
September 30, 1991
Date of Creation:
1991
Title:
Assessment of GaAs device quality and reliability, 1991 / prepared by Reliability Analysis Center.
Application Title:
Critical review and technology assessments '91-'92.
Basis of Claim:
New Matter: "compilation and some new text."
Description:
1 v.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Electrostatic discharge susceptibility data, 1995

Process action team handbook, 1992

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003426396 / 1992-11-03
Date of Publication:
March 30, 1992
Date of Creation:
1992
Title:
Process action team handbook, 1992 : state-of-the-art report / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: "compilation and some new text."
Series:
SOAR ; 8
Description:
1 v.
Other Title:
SOAR ; 8
Copyright Claimant:
IIT Research Institute
Authorship on Application:
IIT Research Institute, employer for hire.
Names:
Reliability Analysis Center
IIT Research Institute

Introduction to concurrent engineering

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003462455 / 1992-12-28
Date of Publication:
October 27, 1992
Date of Creation:
1992
Title:
Introduction to concurrent engineering : electronic circuit design and production applications, 1992 / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: "compilation and some new text."
Variant title:
Introduction to concurrent engineering : electronic circuit design and production applications, 1992
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute

Reliability and maintainability definitions

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003482250 / 1992-12-28
Date of Publication:
October 13, 1992
Date of Creation:
1992
Title:
Reliability and maintainability definitions.
Basis of Claim:
New Matter: compilation and additions.
Series:
RAC Quick Reference Guides
Description:
cards.
Copyright Claimant:
IIT Research Institute
Names:
IIT Research Institute (65 documents)
example document: Software engineering process group handbook

Worst case circuit analysis application guidelines, 1993

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003557279 / 1993-05-18
Date of Publication:
April 14, 1993
Date of Creation:
1993
Title:
Worst case circuit analysis application guidelines, 1993.
Basis of Claim:
New Matter: compilation & additions.
Imprint:
Rome, NY : Reliability Analysis Center, 1993.
Description:
88 p.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
IIT Research Institute

TQM toolkit

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003631346 / 1993-08-25
Date of Publication:
August 3, 1993
Date of Creation:
1993
Title:
TQM toolkit : 1993 / prepared by Reliability Analysis Center.
Application Title:
Total quality management toolkit.
Basis of Claim:
New Matter: compilation & some new text.
Imprint:
Rome, NY : Reliability Analysis Center, c1993.
Description:
115 p.
Variant title:
TQM toolkit : 1993
Other Title:
Total quality management toolkit
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Failure mode/mechanism distributions, 1991

Mechanical applications in reliability engineering, 1993

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003679281 / 1993-11-15
Date of Publication:
October 25, 1993
Date of Creation:
1993
Title:
Mechanical applications in reliability engineering, 1993 / prepared by Richard J. Sadlon.
Basis of Claim:
New Matter: compilation & additions.
Imprint:
Rome, NY : Reliability Analysis Center, c1993.
Description:
176 p.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Richard J. Sadlon
IIT Research Institute

Parts selection, application and control

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003692887 / 1993-12-09
Date of Publication:
November 5, 1993
Date of Creation:
1993
Title:
Parts selection, application and control.
Basis of Claim:
New Matter: compilation & some new text.
Imprint:
Rome, NY : Reliability Analysis Center, 1993.
Description:
228 p.
Copyright Claimant:
IIT Research Institute
Names:
IIT Research Institute

Nonelectronic parts reliability data, 1995

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003886976 / 1994-09-26
Date of Publication:
September 7, 1994
Date of Creation:
1994
Title:
Nonelectronic parts reliability data, 1995.
Basis of Claim:
New Matter: compilation & some text.
Description:
1 v.
Copyright Claimant:
IIT Research Institute
Names:
IIT Research Institute (65 documents)
example document: Electrostatic discharge susceptibility data

Reliable application of multichip modules, 1995

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004193829 / 1996-01-18
Date of Publication:
December 7, 1995
Date of Creation:
1995
Title:
Reliable application of multichip modules, 1995 / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & new text.
Description:
112 p.
Other Title:
Reliability Analysis Center
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
IIT Research Institute

RAC thermal management guidebook

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004193830 / 1996-01-18
Date of Publication:
December 26, 1995
Date of Creation:
1995
Title:
RAC thermal management guidebook / Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & new text.
Description:
98 p.
Other Title:
Reliability Analysis Center
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
IIT Research Institute

Electrical overstress/electrostatic discharge (EOS/ESD) guidelines

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004193831 / 1996-01-18
Date of Publication:
October 20, 1995
Date of Creation:
1995
Title:
Electrical overstress/electrostatic discharge (EOS/ESD) guidelines / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & new text.
Description:
66 p.
Other Title:
Reliability Analysis Center
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
IIT Research Institute

The reliability sourcebook

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004201781 / 1996-01-18
Date of Publication:
March 5, 1993
Date of Creation:
1993
Title:
The reliability sourcebook : "how and where to get R&M data and information" / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & additions.
Copyright Note:
C.O. correspondence.
Imprint:
Rome, NY : Reliability Analysis Center, 1993.
Description:
72 p.
Variant title:
The reliability sourcebook : "how and where to get R&M data and information"
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Electrostatic discharge susceptibility data, 1995

Service life extension assessment

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004201782 / 1996-01-18
Date of Publication:
September 22, 1995
Date of Creation:
1995
Title:
Service life extension assessment / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & additions.
Copyright Note:
C.O. correspondence.
Imprint:
Rome, NY : Reliability Analysis Center, [1995]
Description:
1 v.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute

Environmental characterization device sourcebook

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004201783 / 1996-01-18
Date of Publication:
October 5, 1995
Date of Creation:
1995
Title:
Environmental characterization device sourcebook / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & additions.
Copyright Note:
C.O. correspondence.
Imprint:
Rome, NY : Reliability Analysis Center, c1995.
Description:
1 v.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute

Reliable application of plastic encapsulated microcircuits

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004230618 / 1996-02-23
Date of Publication:
February 5, 1996
Date of Creation:
1996
Title:
Reliable application of plastic encapsulated microcircuits / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & some new text.
Description:
138 p.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
IIT Research Institute (65 documents)
example document: Benchmarking commercial reliability practices
Reliability Analysis Center (Rome, NY)

Practical statistical tools for the reliability engineer

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0005145386 / 2000-03-13
Date of Publication:
January 6, 2000
Date of Creation:
1999
Title:
Practical statistical tools for the reliability engineer / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & some new text.
Description:
108 p.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Electrostatic discharge control manufacturing guidelines

Reliable application of optoelectronic devices

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0005145387 / 2000-03-13
Date of Publication:
October 22, 1998
Date of Creation:
1998
Title:
Reliable application of optoelectronic devices / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & some new text.
Series:
RAC parts selection, application, and control series
Description:
120 p.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute

Failure reporting, analysis, and corrective action system (FRACAS) application guidelines

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0005145388 / 2000-03-13
Date of Publication:
November 16, 1999
Date of Creation:
1999
Title:
Failure reporting, analysis, and corrective action system (FRACAS) application guidelines / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: compilation & some new text.
Description:
168 p.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute

Microcircuit device reliability

Title:
Microcircuit device reliability / Reliability Analysis Center.
Application Title:
Memory/digital L S I data ....
Copyright Note:
No issues recorded for year
Serial Publication Year:
1983
Imprint:
Griffiss Air Force Base, N. Y. : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Description based on:
No. 6, autumn 1977.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Failure mode/mechanism distributions, 1991

Microcircuit device reliability

Title:
Microcircuit device reliability / Reliability Analysis Center.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1986
Imprint:
Griffiss Air Force Base, N. Y. : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Other Title:
Digital SSI/MSI data
Field experience database
Microcircuit device reliability trend analysis, 1985
Description based on:
No. 6, autumn 77.
Authorship on Application:
text & compilation: I I T Research Institute, employer for hire.
Names:
Susan B. Stockman
Donald E. Rash
Thomas A. Ballou
Reliability Analysis Center
IIT Research Institute

Nonelectronic parts reliability data

Title:
Nonelectronic parts reliability data / Reliability Analysis Center ; prepared by Donald W. Fulton.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1979
Imprint:
Griffiss Air Force Base, N. Y. : RAC, 1978-.
Description:
print material.
Frequency:
Frequency unknown.
Publication History:
No. 1-
Authorship on Application:
data analysis & compilation: I I T Research Institute, employer for hire.
Names:
Donald W. Fulton
Reliability Analysis Center
IIT Research Institute

Nonelectronic parts reliability data

Title:
Nonelectronic parts reliability data / Reliability Analysis Center ; prepared by Robert G. Arno.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1983
Imprint:
Griffiss A F B, NY : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Description based on:
Rept. no. NPRD-2, summer 1981 issue.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Robert G. Arno
Reliability Analysis Center
IIT Research Institute (65 documents)
example document: Failure mode/mechanism distributions, 1991

Electronic equipment maintainability data

Title:
Electronic equipment maintainability data / Reliability Analysis Center ; prepared by Norman B. Fuqua.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1981
Imprint:
Griffiss Air Force Base, NY : RAC, 1980-.
Description:
print material.
Frequency:
Frequency unknown.
Publication History:
Fall 1980-
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Norman B. Fuqua
Reliability Analysis Center
IIT Research Institute

Electronic equipment reliability data

Title:
Electronic equipment reliability data / Reliability Analysis Center ; prepared by Karl H. Huss.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1981
Imprint:
Griffiss Air Force Base, NY : RAC, 1980-.
Description:
print material.
Frequency:
Frequency unknown.
Publication History:
Fall 1980-
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Karl H. Huss
Reliability Analysis Center
IIT Research Institute

ESD protective material and equipment

Title:
ESD protective material and equipment : a critical review : state-of-the-art-report / Reliability Analysis Center ; prepared by Norman B. Fuqua.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1983
Imprint:
Griffiss Air Force Base, NY : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Description based on:
Spring 1982 issue.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Norman B. Fuqua
Reliability Analysis Center
IIT Research Institute

Reliability & maintainability software tools

Title:
Reliability & maintainability software tools / prepared by Reliability Analysis Center.
Basis of Claim:
New matter: compilation & additions.
Serial Publication Year:
1993
Description:
print material.
Frequency:
Frequency unknown.
Description based on:
1993 issue.
Copyright Claimant:
IIT Research Institute (employer for hire)
Names:
Reliability Analysis Center
IIT Research Institute
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