Requirements for the control of electromagnetic interference emissions and susceptibility characteristics of equipment intended to operate in severe electromagnetic environments part 2
Electronic Industries Association-Consumer Electronics Group product and packaging bar code standard
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993449 / 1999-05-18
Date of Publication:
July 10, 1995
Date of Creation:
1995
Title:
Electronic Industries Association-Consumer Electronics Group product and packaging bar code standard : EIA-621.
Imprint:
Arlington, VA : Electronic Industries Association, 1995.
Description:
40 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Data management in-house training course
example document: Data management in-house training course
|
A procedure for measuring N-channel MOSFET hot-carrier-induced degradation at maximum substrate current under DC stress
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993450 / 1999-05-18
Date of Publication:
August 15, 1995
Date of Creation:
1995
Title:
A procedure for measuring N-channel MOSFET hot-carrier-induced degradation at maximum substrate current under DC stress : EIA/JESD28.
Imprint:
Arlington, VA : Electronic Industries Association, 1995.
Description:
11 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC standard.
Names:
Electronic Industries Association (1005 documents)
example document: Lightning strike test procedure for electrical connectors
example document: Lightning strike test procedure for electrical connectors
Test method B107-A
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993451 / 1999-05-18
Date of Publication:
September 16, 1995
Date of Creation:
1995
Title:
Test method B107-A : marking permanency : EIA/JESD22-B107-A.
Imprint:
Arlington, VA : Electronic Industries Association, 1995.
Description:
4 p.
Variant title:
Test method B107-A : marking permanency
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC standard.
Names:
Electronic Industries Association (1005 documents)
example document: Blank detail specification for fiber optic communications cable for indoor use--optical with metallic elements (construction 2)
example document: Blank detail specification for fiber optic communications cable for indoor use--optical with metallic elements (construction 2)
Test method A113-A
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993452 / 1999-05-18
Date of Publication:
June 15, 1995
Date of Creation:
1995
Title:
Test method A113-A : preconditioning of plastic surface mount devices prior to reliability testing : JESD22-A113-A.
Basis of Claim:
New Matter: revisions.
Previous Registration:
Prev. reg. 1994, TX 3-820-173.
Imprint:
Arlington, VA : Electronic Industries Association, 1995.
Description:
5 p.
Variant title:
Test method A113-A : preconditioning of plastic surface mount devices prior to reliability testing
Copyright Claimant:
Electronic Industries Association
Notes:
JEDEC standard.
Names:
Electronic Industries Association (1005 documents)
example document: Measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF
example document: Measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF
Detail specification for 1.0 mm, two-part connectors for use with parallel printed boards
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993453 / 1999-05-18
Date of Publication:
April 10, 1996
Date of Creation:
1996
Title:
Detail specification for 1.0 mm, two-part connectors for use with parallel printed boards : EIA-700AAAB.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
38 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA specification.
Names:
Electronic Industries Association (1005 documents)
example document: Detail specification on 2 pole toggle switches
example document: Detail specification on 2 pole toggle switches
Standard for chain description file
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993454 / 1999-05-18
Date of Publication:
June 17, 1996
Date of Creation:
1996
Title:
Standard for chain description file : EIA/JESD32.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
12 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC standard.
Names:
Electronic Industries Association (1005 documents)
example document: Detail specification for 2 pole, 5 A relay sockets
example document: Detail specification for 2 pole, 5 A relay sockets
Ceramic capacitor qualification specification
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993455 / 1999-05-18
Date of Publication:
May 15, 1996
Date of Creation:
1996
Title:
Ceramic capacitor qualification specification : EIA/IS-692.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
16 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA interim standard.
Names:
Test method A105-B
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993456 / 1999-05-18
Date of Publication:
February 1, 1996
Date of Creation:
1996
Title:
Test method A105-B : power and temperature cycling : EIA/JESD22-A105-B.
Basis of Claim:
New Matter: revisions.
Previous Registration:
Prev. reg.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
4 p.
Variant title:
Test method A105-B : power and temperature cycling
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC standard.
Names:
Electronic Industries Association (1005 documents)
example document: Methodology for the thermal measurement of component packages (single semiconductor device)
example document: Methodology for the thermal measurement of component packages (single semiconductor device)
Production ball grid array (BGA) socket test specification
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993457 / 1999-05-18
Date of Publication:
July 18, 1996
Date of Creation:
1996
Title:
Production ball grid array (BGA) socket test specification : EIA/IS-701.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
46 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA interim standard.
Names:
Electronic Industries Association (1005 documents)
example document: Blank detail specification for special-use sensitive switches of certified quality
example document: Blank detail specification for special-use sensitive switches of certified quality
Requirements for the control of electromagnetic interference emissions and susceptibility characteristics of equipment intended to operate in severe electromagnetic environments
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993458 / 1999-05-18
Date of Publication:
May 15, 1996
Date of Creation:
1996
Title:
Requirements for the control of electromagnetic interference emissions and susceptibility characteristics of equipment intended to operate in severe electromagnetic environments : EIA/IS-647.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
68 p.
Variant title:
Requirements for the control of electromagnetic interference emissions and susceptibility characteristics
Copyright Claimant:
Electronic Industries Association
Notes:
EIA interim standard.
Names:
Consumer camcorder or video camera low light performance
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993459 / 1999-05-18
Date of Publication:
July 18, 1996
Date of Creation:
1996
Title:
Consumer camcorder or video camera low light performance : EIA-639.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
11 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Detail specification--nonmechanically actuated flexible carrier sockets for pin grid array for use in electronic equipment
example document: Detail specification--nonmechanically actuated flexible carrier sockets for pin grid array for use in electronic equipment
Guideline for developing and documenting package electrical models derived from computational analysis
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993460 / 1999-05-18
Date of Publication:
May 8, 1996
Date of Creation:
1996
Title:
Guideline for developing and documenting package electrical models derived from computational analysis : EIA/JEP126.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
4 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC publication.
Names:
Electronic Industries Association (1005 documents)
example document: Cellular radiotelecommunications intersystem operations
example document: Cellular radiotelecommunications intersystem operations
Test criteria for the wafer-level testing of thin dielectrics
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993461 / 1999-05-18
Date of Publication:
February 1, 1996
Date of Creation:
1996
Title:
Test criteria for the wafer-level testing of thin dielectrics : EIA/JESD35-2.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
4 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC publication.
Names:
Electronic Industries Association (1005 documents)
example document: Cellular radiotelecommunications intersystem operations
example document: Cellular radiotelecommunications intersystem operations
Test procedure for the measurement of single-event effects in semiconductor devices from heavy ion irradiation
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993462 / 1999-05-18
Date of Publication:
December 16, 1996
Date of Creation:
1996
Title:
Test procedure for the measurement of single-event effects in semiconductor devices from heavy ion irradiation : EIA/JESD57.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
40 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC standard.
Names:
Electronic Industries Association (1005 documents)
example document: General guidelines for designing test structures for the wafer-level testing of thin dielectrics
example document: General guidelines for designing test structures for the wafer-level testing of thin dielectrics
Probe damage test procedure for electrical connectors
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993463 / 1999-05-18
Date of Publication:
April 1, 1997
Date of Creation:
1997
Title:
Probe damage test procedure for electrical connectors : TP-25B : EIA-364-25B.
Basis of Claim:
New Matter: revisions.
Previous Registration:
Prev. reg. 1983, TX 1-093-845.
Imprint:
Arlington, VA : Electronic Industries Association, 1997.
Description:
5 p.
Number of similar titles:
2
Variant title:
Probe damage test procedure for electrical connectors : TP-25B
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Electrostatic discharge (ESD) sensitivity testing human body model (HBM)
example document: Electrostatic discharge (ESD) sensitivity testing human body model (HBM)
Vibration test procedure for electrical connectors and sockets
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993464 / 1999-05-18
Date of Publication:
June 2, 1997
Date of Creation:
1997
Title:
Vibration test procedure for electrical connectors and sockets : TP-28C : EIA-364-28C.
Basis of Claim:
New Matter: revisions.
Previous Registration:
Prev. reg. 1983, TX 1-093-838.
Imprint:
Arlington, VA : Electronic Industries Association, 1997.
Description:
18 p.
Number of similar titles:
1
Variant title:
Vibration test procedure for electrical connectors and sockets : TP-28C
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Measurement of reverse recovery time for semiconductor signal diodes
example document: Measurement of reverse recovery time for semiconductor signal diodes
Assessment guide for process certification
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993465 / 1999-05-18
Date of Publication:
July 18, 1996
Date of Creation:
1996
Title:
Assessment guide for process certification : EIA-681.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
50 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA guidline.
Names:
Electronic Industries Association (1005 documents)
example document: Cellular radiotelecommunications intersystem operations--automatic roaming
example document: Cellular radiotelecommunications intersystem operations--automatic roaming
Mechanical shock (specified pulse) test procedure for electrical connectors
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993466 / 1999-05-18
Date of Publication:
June 20, 1996
Date of Creation:
1996
Title:
Mechanical shock (specified pulse) test procedure for electrical connectors : TP-27B : EIA-364-27B.
Basis of Claim:
New Matter: revisions.
Previous Registration:
Prev. reg. 1983, TX 1-227-729.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
11 p.
Variant title:
Mechanical shock (specified pulse) test procedure for electrical connectors : TP-27B
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Detail specification for non-sensitive pushbutton switch single-pole contacts
example document: Detail specification for non-sensitive pushbutton switch single-pole contacts
Power line/radio frequency symbol encoding sublayer
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993467 / 1999-05-18
Date of Publication:
November 10, 1997
Date of Creation:
1997
Title:
Power line/radio frequency symbol encoding sublayer : EIA-600.38.
Imprint:
Arlington, VA : Electronic Industries Association, 1997.
Description:
40 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Detail specification for surface mountable dual in-line switches of certified quality
example document: Detail specification for surface mountable dual in-line switches of certified quality
Symbol-encoding sublayer
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993468 / 1999-05-18
Date of Publication:
November 10, 1997
Date of Creation:
1997
Title:
Symbol-encoding sublayer : EIA-600.37.
Imprint:
Arlington, VA : Electronic Industries Association, 1997.
Description:
26 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Standard test methods for electromechanical switches
example document: Standard test methods for electromechanical switches
Transport of content advisory information using extended data service (XDS)
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993469 / 1999-05-18
Date of Publication:
October 15, 1997
Date of Creation:
1997
Title:
Transport of content advisory information using extended data service (XDS) : EIA-744.
Imprint:
Arlington, VA : Electronic Industries Association, 1997.
Description:
4 p.
Number of similar titles:
1
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Measurement of reverse recovery time for semiconductor signal diodes
example document: Measurement of reverse recovery time for semiconductor signal diodes
Transport of cable channel mapping system information using extended data service (XDS)
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993470 / 1999-05-18
Date of Publication:
October 15, 1997
Date of Creation:
1997
Title:
Transport of cable channel mapping system information using extended data service (XDS) : EIA-745.
Imprint:
Arlington, VA : Electronic Industries Association, 1997.
Description:
4 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Cellular radio-telecommunications intersystem operations
example document: Cellular radio-telecommunications intersystem operations
Generic specification for special-use electromechanical switches of certified quality
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993474 / 1999-05-18
Date of Publication:
July 8, 1996
Date of Creation:
1996
Title:
Generic specification for special-use electromechanical switches of certified quality : EIA-5200000-C.
Basis of Claim:
New Matter: revisions.
Previous Registration:
Prev. reg. 1993, TX 3-678-877.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
1 v.
Number of similar titles:
2
Copyright Claimant:
Electronic Industries Association
Notes:
EIA specification.
Names:
Electronic Industries Association (1005 documents)
example document: Cellular radiotelecommunications intersystem operations
example document: Cellular radiotelecommunications intersystem operations
Coax cable physical layer & medium specification
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993479 / 1999-05-18
Date of Publication:
February 20, 1998
Date of Creation:
1998
Title:
Coax cable physical layer & medium specification : EIA-600.33.
Imprint:
Arlington, VA : Electronic Industries Association, 1998.
Description:
51 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Fiber optic cable tensile loading and bending test
example document: Fiber optic cable tensile loading and bending test
Guide for standard probe pad sizes and layouts for wafer-level electrical testing
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993482 / 1999-05-18
Date of Publication:
November 15, 1996
Date of Creation:
1996
Title:
Guide for standard probe pad sizes and layouts for wafer-level electrical testing : EIA/JEP128.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
6 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC publication.
Names:
Electronic Industries Association (1005 documents)
example document: Measurement of optical fiber macrobend attenuation
example document: Measurement of optical fiber macrobend attenuation
Specification for small form factor 45.7 mm (1.8 in) disk drives, 15 mm (0.59 in) high
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993483 / 1999-05-18
Date of Publication:
October 15, 1996
Date of Creation:
1996
Title:
Specification for small form factor 45.7 mm (1.8 in) disk drives, 15 mm (0.59 in) high : EIA-676.
Imprint:
Arlington, VA : Electronic Industries Association, 1996.
Description:
7 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA specification.
Names:
Electronic Industries Association (1005 documents)
example document: Lightning strike test procedure for electrical connectors
example document: Lightning strike test procedure for electrical connectors
Maintenance aging test procedure for electrical connectors
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993484 / 1999-05-18
Date of Publication:
May 20, 1998
Date of Creation:
1998
Title:
Maintenance aging test procedure for electrical connectors : TP-24B : EIA-364-24B.
Basis of Claim:
New Matter: revisions.
Previous Registration:
Prev. reg. 1983, TX 1-093-839.
Imprint:
Arlington, VA : Electronic Industries Association, 1998.
Description:
3 p.
Number of similar titles:
1
Variant title:
Maintenance aging test procedure for electrical connectors : TP-24B
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Standard test methods for passive electronic component parts
example document: Standard test methods for passive electronic component parts
Surface mount solderability test
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993486 / 1999-05-18
Date of Publication:
July 10, 1995
Date of Creation:
1995
Title:
Surface mount solderability test : EIA-638.
Imprint:
Arlington, VA : Electronic Industries Association, 1995.
Description:
7 p.
Number of similar titles:
1
Copyright Claimant:
Electronic Industries Association
Notes:
EIA standard.
Names:
Electronic Industries Association (1005 documents)
example document: Data management in-house training course
example document: Data management in-house training course
Standard for failure analysis report format
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993488 / 1999-05-18
Date of Publication:
December 15, 1995
Date of Creation:
1995
Title:
Standard for failure analysis report format : EIA/JESD38.
Imprint:
Arlington, VA : Electronic Industries Association, 1995.
Description:
8 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA/JEDEC standard.
Names:
Electronic Industries Association (1005 documents)
example document: Detail specification, miniature thumbwheel actuated digital switch, high panel density
example document: Detail specification, miniature thumbwheel actuated digital switch, high panel density
Detail specification for rotary switches of certified quality (low current rating) 16 positions maximum
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0004993489 / 1999-05-18
Date of Publication:
December 15, 1995
Date of Creation:
1995
Title:
Detail specification for rotary switches of certified quality (low current rating) 16 positions maximum : EIA-520FAAB.
Imprint:
Arlington, VA : Electronic Industries Association, 1995.
Description:
12 p.
Copyright Claimant:
Electronic Industries Association
Notes:
EIA specification.
Names:
Electronic Industries Association (1005 documents)
example document: Cellular radiotelecommunications intersystem operations
example document: Cellular radiotelecommunications intersystem operations
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