Search and retrieval index to E O S/E S D symposium proceedings, 1979 to 1984, Digital failure rate data



Microcircuit screening effectiveness

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0000165409 / 1978-12-26
Date of Publication:
December 5, 1978
Date of Creation:
1978
Title:
Microcircuit screening effectiveness / prepared by Henry C. Rickers ; under contract to Rome Air Development Center.
Series:
Technical reliability study ; TRS-1
Imprint:
Griffiss Air Force Base, NY : Reliability Analysis Center, 1978.
Description:
100 p.
Other Title:
Technical reliability study ; TRS-1
Copyright Claimant:
I I T Research Institute
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Henry C. Rickers
Rome Air Development Center (2 documents)
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IIT Research Institute (101 documents)
example document: Maintainability toolkit

Copyrights records by IIT Research Institute

Electrical Overstress/Electrostatic Discharge Symposium, proceedings 1979

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0000594853 / 1980-10-08
Date of Publication:
January 11, 1980
Date of Creation:
1979
Title:
Electrical Overstress/Electrostatic Discharge Symposium, proceedings 1979 : Denver, Colorado, September 24-27, 1979 / sponsored by I I T Research Institute.
Basis of Claim:
New Matter: compilation.
Copyright Note:
C.O. correspondence.
Imprint:
Griffiss A F B, N. Y. : Reliability Analysis Center, c1980.
Description:
224 p.
Other Title:
E S D/E OS symposium proceedings
Copyright Claimant:
I I T Research Institute
Notes:
Spine ti.: E S D/E O S symposium proceedings.
Names:
IIT Research Institute (101 documents)
example document: Electrostatic discharge susceptibility data
Electrical Overstress/Electrostatic Discharge Symposium, Denver, 1979

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1980

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0000696427 / 1981-05-21
Date of Publication:
January 14, 1981
Date of Creation:
1980
Title:
Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1980 : San Diego, California, September 9-11, 1980 / sponsored by I I T Research Institute.
Basis of Claim:
New Matter: compilation.
Imprint:
Griffiss Air Force Base, N. Y. : Reliability Analysis Center, Rome Air Development Center, c1981.
Description:
248 p.
Other Title:
ESD-EOS Symposium proceedings
Copyright Claimant:
I I T Research Institute
Notes:
Spine ti.: ESD-EOS Symposium proceedings.
Authorship on Application:
symposium sponsor: I I T Research Institute, employer for hire.
Names:
IIT Research Institute (101 documents)
example document: Electrostatic discharge susceptibility data of microcircuit
Electrical Overstress/Electrostatic Discharge Symposium, San Diego, 1980
ESD-EOS Symposium.

Search and retrieval index to E O S/E S D symposium proceedings, 1979 to 1984

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0001743501 / 1986-01-21
Date of Publication:
July 17, 1985
Date of Creation:
1985
Title:
Search and retrieval index to E O S/E S D symposium proceedings, 1979 to 1984 / prepared by Donald Rash, Richard Wanner.
Application Title:
Technical reliability studies, Search and retrieval index to E O S/E S D symposium proceedings, 1979 to 1984 (TRS-4)
Series:
Technical reliability studies ; TRS-4
Imprint:
Griffiss Air Force Base, NY : Reliability Analysis Center, 1985.
Description:
1 v.
Other Title:
Technical reliability studies ; TRS-4
Copyright Claimant:
I I T Research Institute
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
Donald Rash
Richard Wanner
IIT Research Institute (101 documents)
example document: Software engineering process group handbook

Confidence bounds for system reliability

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0001790401 / 1985-12-16
Date of Publication:
August 12, 1985
Date of Creation:
1985
Title:
Confidence bounds for system reliability : state-of-the-art report.
Basis of Claim:
New Matter: "revisions, compilations, and some new text."
Copyright Note:
C.O. correspondence.
Series:
SOAR;4
Other Title:
S O A R ;4
Copyright Claimant:
I I T Research Institute
Notes:
Cataloged from appl.
Names:
IIT Research Institute (101 documents)
example document: Failure mode, effects, and criticality analysis (FMECA)

Search and retrieval index to I S T F A processings [sic], 1978 to 1985

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0002033843 / 1987-03-16
Date of Publication:
February 6, 1987
Date of Creation:
1986
Date in Notice:
notice: 1986
Title:
Search and retrieval index to I S T F A processings [sic], 1978 to 1985 / prepared by Anne Mosca and William Cesare.
Application Title:
Search and retrieval index to I S T F A proceedings, 1978 to 1985.
Basis of Claim:
New Matter: "compilation and some new text."
Series:
Technical and reliabililty studies
Imprint:
Griffis Air Force Base, N. Y. : Rome Air Development Center, c1986.
Description:
1 v.
Other Title:
I S T F A processings [sic], 1978 to 1985
I S T F A proceedings, 1978 to 1985
Copyright Claimant:
I I T Research Institute
Authorship on Application:
compilation and some new text: I I T Research Institute, employer for hire.
Names:
Anne Mosca
William Cesare
IIT Research Institute (101 documents)
example document: Search and retrieval index to I R P S proceedings, 1968 to 1978

Microcircuit screening analysis, 1987

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0002250689 / 1988-02-04
Date of Publication:
December 17, 1987
Date of Creation:
1987
Title:
Microcircuit screening analysis, 1987 / prepared by the Reliability Analysis Center.
Application Title:
Microcircuit screening analysis--MDR-22A.
Basis of Claim:
New Matter: "compilation and some new text."
Description:
1 v.
Other Title:
Reliability Analysis Center
Copyright Claimant:
I I T Research Institute
Authorship on Application:
compilation and new text: I I T Research Institute, employer for hire.
Names:
IIT Research Institute (101 documents)
example document: Failure mode, effects, and criticality analysis (FMECA)

Discrete semiconductor device reliability

Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0002467564 / 1988-12-15
Date of Publication:
July 22, 1988
Date of Creation:
1988
Title:
Discrete semiconductor device reliability / prepared by Mary G. Priore.
Basis of Claim:
New Matter: "compilation and some new text."
Description:
102 p.
Copyright Claimant:
I I T Research Institute
Authorship on Application:
compilation & some new text: I I T Research Institute, employer for hire.
Names:
Mary G. Priore
IIT Research Institute (101 documents)
example document: Benchmarking commercial reliability practices

The umbria collection

Type of Work:
Art work
Registration Number / Date:
VA0000874056 / 1997-09-08
Date of Publication:
May 1, 1997
Date of Creation:
1994
Title:
The umbria collection.
Description:
Art reproduction.
Copyright Claimant:
David Shaw Nicholls, 1959-
Notes:
Textile.
Names:
David Shaw Nicholls 1959-

Portree design

Type of Work:
Art work
Registration Number / Date:
VA0001025582 / 2000-02-16
Date of Publication:
June 1, 1998
Date of Creation:
1997
Title:
Portree design : runner.
Application Title:
Portree.
Description:
Rug.
Other Title:
Portree.
Copyright Claimant:
David Shaw Nicholls, 1959-
Names:
David Shaw Nicholls 1959-

Carlisle design--runner

Type of Work:
Art work
Registration Number / Date:
VA0001028015 / 2000-02-16
Date of Publication:
June 1, 1998
Date of Creation:
1997
Title:
Carlisle design--runner.
Description:
Rug.
Copyright Claimant:
David Shaw Nicholls, 1959-
Names:
David Shaw Nicholls 1959-

Argyle design

Type of Work:
Art work
Registration Number / Date:
VA0001028954 / 2000-02-16
Date of Publication:
June 1, 1998
Date of Creation:
1997
Title:
Argyle design.
Application Title:
Argyle.
Description:
Rug.
Copyright Claimant:
David Shaw Nicholls, 1959-
Names:
David Shaw Nicholls 1959-

Abacus hi-lo design-runner

Type of Work:
Art work
Registration Number / Date:
VA0001028955 / 2000-02-16
Date of Publication:
May 1, 1997
Date of Creation:
1996
Title:
Abacus hi-lo design-runner.
Application Title:
Abacus.
Description:
Rug.
Copyright Claimant:
David Shaw Nicholls, 1959-
Names:
David Shaw Nicholls 1959-

Lima honey/wheat hi-lo design

Type of Work:
Art work
Registration Number / Date:
VA0001028956 / 2000-02-16
Date of Publication:
May 1, 1997
Date of Creation:
1996
Title:
Lima honey/wheat hi-lo design.
Application Title:
Lima hi-lo.
Description:
Rug.
Copyright Claimant:
David Shaw Nicholls, 1959-
Names:
David Shaw Nicholls 1959-

Flores design

Type of Work:
Art work
Registration Number / Date:
VA0001028996 / 2000-02-17
Date of Publication:
May 1, 1997
Date of Creation:
1996
Title:
Flores design.
Application Title:
Flores.
Description:
Art reproduction.
Copyright Claimant:
David Shaw Nicholls, 1959-
Notes:
Design for rug.
Names:
David Shaw Nicholls 1959-

Prado

Type of Work:
Art work
Registration Number / Date:
VA0001268681 / 2004-03-31
Date of Publication:
January 1, 1998
Date of Creation:
1998
Title:
Prado.
Previous Registration:
Prev. reg. 2002, VAu 524-511.
Description:
Art reproduction.
Copyright Claimant:
David Shaw Nicholls, 1959-
Notes:
Rug design.
Names:
David Shaw Nicholls 1959-

Microcircuit device reliability

Title:
Microcircuit device reliability / Reliability Analysis Center.
Basis of Claim:
New matter: additions.
Serial Publication Year:
1979
Imprint:
Griffiss Air Force Base, N. Y. : RAC.
Description:
print material.
Frequency:
Frequency unknown.
Number of similar titles:
6
Other Title:
Hybrid circuit data
Description based on:
No. 6, autumn 77.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
data compilation & analysis: I I T Research Institute, employer for hire.
Names:
Timothy E. Turner (3 documents)
example document: Refused blue two
IIT Research Institute (101 documents)
example document: Software engineering process group handbook

Digital failure rate data

Title:
Digital failure rate data / prepared by David B. Nicholls.
Basis of Claim:
New matter: additions.
Copyright Note:
No issues recorded for year
Serial Publication Year:
1980
Imprint:
Griffiss Air Force Base, NY : Rome Air Development Center.
Description:
print material.
Frequency:
Annually.
Number of similar titles:
2
Other Title:
Microcircuit device reliability ; MDR-12
Description based on:
Summer 1979 issue.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
David B. Nicholls

Copyrights records by Nicholls, David B.

IIT Research Institute.

Copyrights records by IIT Research Institute.

Digital failure rate data

Title:
Digital failure rate data / prepared by David B. Nicholls.
Basis of Claim:
New matter: additions.
Serial Publication Year:
1979
Imprint:
Griffiss Air Force Base, NY : Rome Air Development Center.
Description:
print material.
Frequency:
Annually.
Number of similar titles:
2
Other Title:
Microcircuit device reliability ; MDR-12
Description based on:
Summer 1979 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
David B. Nicholls
IIT Research Institute.

Digital failure rate data

Title:
Digital failure rate data / prepared by David B. Nicholls.
Serial Publication Year:
1981
Imprint:
Griffiss Air Force Base, NY : Rome Air Development Center.
Description:
print material.
Frequency:
Annually.
Number of similar titles:
2
Other Title:
Microcircuit device reliability ; MDR-17
Description based on:
Summer 1979 issue.
Copyright Claimant:
I I T Research Institute.
Authorship on Application:
I I T Research Institute, employer for hire.
Names:
David B. Nicholls
IIT Research Institute (101 documents)
example document: Maintainability toolkit

Snatch Apple

Type of Work:
Musical work
Registration Number / Date:
PAu003111644 / 2007-03-30
Date of Creation:
2007
Title:
Snatch Apple : 2 songs.
Copyright Note:
Cataloged from appl. only.
Copyright Claimant:
David E. Nicholls, 1955-, Isaac R. Nicholls, 1986-, Michael S. Alfred, 1974-
Names:
David E. Nicholls 1955-
Isaac R. Nicholls 1986-
Michael S. Alfred 1974-
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