Worldwide reliability & maintainability standards: a primer of US and non-US commercial and government documents
Fault tree analysis application guide & 32 other titles
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Date of Execution:
December 31, 1969
Title:
Fault tree analysis application guide & 32 other titles.
Notes:
Guarantee and collateral agreement.
Names:
Inc. Alion Science And Technology Corporation & Human Factors Applications
Credit Suisse First Boston, acting through its Cayman Island Branch.
Alion Science And Technology Corporation
Human Factors Applications, Inc.
Credit Suisse First Boston (35 documents)
example document: Carnival in Rio & 478 other titles
Credit Suisse First Boston, acting through its Cayman Island Branch.
Alion Science And Technology Corporation
Human Factors Applications, Inc.
Credit Suisse First Boston (35 documents)
example document: Carnival in Rio & 478 other titles
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Fault tree analysis application guide
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 3-069-091.
Title:
Fault tree analysis application guide / Prepared by Reliability Analysis Center; by IIT Research Institute. TX 3-069-091.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
A guide for implementing total quality management: state-of-the-art report
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 3-069-092.
Title:
A guide for implementing total quality management: state-of-the-art report / Prepared by Reliability Analysis Center; by IIT Research Institute. TX 3-069-092.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Process action team handbook
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 3-426-396.
Title:
Process action team handbook / Prepared by Reliability Analysis Center; by IIT Research Institute, employer-for-hire. TX 3-426-396.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Worst case circuit analysis application guidelines, 1993
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 3-557-279.
Title:
Worst case circuit analysis application guidelines, 1993 / By IIT Research Institute, employer-for-hire. TX 3-557-279.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
TQM toolkit: 1993
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 3-631-346.
Title:
TQM toolkit: 1993 / Prepared by Reliability Analysis Center; by IIT Research Institute, employer-for-hire. TX 3-631-346.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Mechanical applications in reliability engineering, 1993
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 3-679-281.
Title:
Mechanical applications in reliability engineering, 1993 / Prepared by Richard J. Sadlon; by IIT Research Institute, employer-for-hire. TX 3-679-281.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Nonelectronic parts reliability data, 1995
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 3-886-976.
Title:
Nonelectronic parts reliability data, 1995 / By IIT Research Institute. TX 3-886-976.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Reliable application of multichip modules, 1995
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-193-829.
Title:
Reliable application of multichip modules, 1995 / Prepared by Reliable Analysis Center; by IIT Research Institute, employer-for-hire. TX 4-193-829.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
RAC thermal management guidebook
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-193-830.
Title:
RAC thermal management guidebook / By Reliability Analysis Center & IIT Research Institute, employer-for-hire. TX 4-193-830.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Electrical overstress/electrostatic discharge (EOS/ESD) guidelines
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-193-831.
Title:
Electrical overstress/electrostatic discharge (EOS/ESD) guidelines / Prepared by Reliability Analysis Center; by IIT Research Institute, employer-for-hire. TX 4-193-831.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Service life extension assessment
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-201-782.
Title:
Service life extension assessment / Prepared by Reliability Analysis Center; by IIT Research Institute, employer-for-hire. TX 4-201-782.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Reliable application of plastic encapsulated microcircuits
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-230-618.
Title:
Reliable application of plastic encapsulated microcircuits / Prepared by Reliability Analysis Center; by IIT Research Institute, employer-for-hire. TX 4-230-618.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Reliable application of capacitors
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-409-515.
Title:
Reliable application of capacitors / By IIT Research Institute. TX 4-409-515.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Worldwide reliability & maintainability standards: a primer of US and non-US commercial and government documents
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-518-867.
Title:
Worldwide reliability & maintainability standards: a primer of US and non-US commercial and government documents / By IIT Research Institute. TX 4-518-867.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Electronic parts reliability data: a compendium of commercial and military device field failure rates, vol. 1-2
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 4-523-787.
Title:
Electronic parts reliability data: a compendium of commercial and military device field failure rates, vol. 1-2 / By IIT Research Institute. TX 4-523-787.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Developing reliability goals/requirements: RBPR-2
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-154-282.
Title:
Developing reliability goals/requirements: RBPR-2 / By IIT Research Institute. TX 5-154-282.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Ensuring reliable performance: RBPR-6
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-154-283.
Title:
Ensuring reliable performance: RBPR-6 / By IIT Research Institute. TX 5-154-283.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Assessing reliability progress: RBPR-4
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-154-285.
Title:
Assessing reliability progress: RBPR-4 / By IIT Research Institute. TX 5-154-285.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Measuring product reliability: RBPR-5
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-154-286.
Title:
Measuring product reliability: RBPR-5 / By IIT Research Institute. TX 5-154-286.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Defining reliability programs: RBPR-1
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-154-287.
Title:
Defining reliability programs: RBPR-1 / By IIT Research Institute. TX 5-154-287.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Electronic derating for optimum performance
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-341-692.
Title:
Electronic derating for optimum performance / Prepared by Reliability Analysis Center. TX 5-341-692.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Evaluation the reliability of commercial off-the-shelf (COTS) items
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-375-396.
Title:
Evaluation the reliability of commercial off-the-shelf (COTS) items / By IIT Research Institute. TX 5-375-396.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Supporting commercial products in military applications
Document number:
V3514D387
Date of Recordation:
September 8, 2004
Entire Copyright Document:
V3514 D387 P1-73
Registration Number Not Verified:
TX 5-375-397.
Title:
Supporting commercial products in military applications / By IIT Research Institute. TX 5-375-397.
Title appears in Document:
Fault tree analysis application guide & 32 other titles.
Fault tree analysis application guide
Type of Work:
Non-dramatic literary work
Registration Number / Date:
TX0003069091 / 1990-10-19
Date of Publication:
June 25, 1990
Date of Creation:
1990
Title:
Fault tree analysis application guide / prepared by Reliability Analysis Center.
Basis of Claim:
New Matter: "compilation and some new text."
Copyright Note:
C.O. correspondence.
Description:
1 v.
Copyright Claimant:
IIT Research Institute
Authorship on Application:
IIT Research Institute, employer for hire.
Names:
Reliability Analysis Center
IIT Research Institute
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IIT Research Institute
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